The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
Dec. 08, 1999
Tong S Chen, Taipei, TW;
Kuang Shin Lin, Taipei, TW;
Zhen Yu Hou, Tianjin, CN;
Xiao Gang Liou, Tianjin, CN;
Inventec Corporation, Taipei, TW;
Abstract
This specification discloses a method and device for computer testing, which method can perform automatic testing for a plurality of computer on the product line. By describing, recording, and summarizing contents and results of each test item using a script, the defects such as lower efficiency, more errors and longer testing time occurred in human operations can be conquered. The method comprises the steps of: building a structured query language (SQL) server; forming electrical communication between the SQL server and a plurality of computers to be tested; retrieving a command macro from the SQL server according to the-command request sent out from the computer to be tested; controlling the computer to be tested to execute corresponding test commands according to the content of the command macro; receiving and analyzing the execution result of the test command; and displaying the testing result.