The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2003

Filed:

Sep. 12, 2000
Applicant:
Inventors:

Samuel Gustman, Santa Monica, CA (US);

Barbara DeLury, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/720 ;
U.S. Cl.
CPC ...
G06F 1/720 ;
Abstract

A survey system and method is described wherein multiple instances or versions of a survey may be defined and data from survey instances may be retained in a cohesive data, or knowledge, base. Each survey version may comprise different sets of questions and different types of answers to the questions. The schema and survey instances may be generated in a computer system implementing embodiments of the present invention. One or more graphical user interfaces is generated by computer programs that facilitate the creation of a survey schema and survey instance from the survey schema as well as capture survey responses. Graphical user interfaces (GUIs) may be used to define, or modify, survey instances and survey schema(s) as well as capture survey data. A change to an element of a survey schema is reflected in a survey instance that includes the element.


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