The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
May. 03, 2001
Applicant:
Inventors:
Joerg Lohse, Munich, DE;
Peter Warkentin, Oberhaching, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/500 ;
Abstract
The objective of the invention is to detect a characteristic in a technical system with reference to model checking. A comparison is made, involving the coordination of several comparative processes, whereby the comparison leads to a result. The comparison is terminated as soon as a comparative process proves that the characteristic is present or not in the appropriate system.
Quick Actions:
Lohse, Joerg. (2003). Method and configuration for comparing a first characteristic with predetermined characteristics of a technical system (U.S. Patent No. 6581026). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6581026
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile