The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
Aug. 10, 2001
Thomas Rapoza, Manchester, CT (US);
Andrew Zink, Stafford Springs, CT (US);
Jeffrey Monroe, Bolton, CT (US);
Gerber Technology, Inc., Tolland, CT (US);
Abstract
In a method for aligning a spatial array of pattern pieces comprising a marker, a work material processing apparatus defining a support surface adapted to carry work material is provided and at least one layer of work is spread thereon. Images of said work material at a reference point and match point are captured and superimposed over one another these superimposed images being projected onto a display. One of said images of said work material at said reference point in said image of said work material at said match point is moved relative to the other to substantially align the images. The position of a matching pattern piece contained within the marker is then moved in accordance with the amount of relative movement to align the pattern of the sheet material within a boundary defined by the matching pattern piece with that defined by the reference pattern piece.