The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
Mar. 30, 2000
James R. Braig, Piedmont, CA (US);
Charles E. Kramer, Poway, CA (US);
Bernhard B. Sterling, Danville, CA (US);
Daniel S. Goldberger, Boulder, CO (US);
Peng Zheng, Alameda, CA (US);
Arthur M. Shulenberger, Brisbane, CA (US);
Rick Trembino, Atlanta, GA (US);
Richard A. King, Berkeley, CA (US);
Casper W. Barnes, Murrieta, CA (US);
Optiscan Biomedical Corporation, Alameda, CA (US);
Abstract
A method and apparatus of determining the analyte concentration of a test sample is described. A temperature gradient is introduced in the test sample and infrared radiation detectors measure radiation at selected analyte absorbance peak and reference wavelengths. The modulation of the temperature gradient is controlled by a surface temperature modulation. A transfer function is determined that relates the surface temperature modulation to the modulation of the measured infrared radiation. Reference and analytical signals are detected. In the presence of the selected analyte, phase and magnitude differences in the transfer function are detected. These phase and magnitude differences, having a relationship to analyte concentration, are measured, correlated, and processed to determine analyte concentration in the test sample.