The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
Oct. 25, 1999
Takashi Mochizuki, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
To estimate the channel characteristics on the basis of the time differences of the sample points, and to reduce memory capacity and processing steps required for the estimation. The first adder sums up detected pilot signals slot by slot, while the second adder sums up ((sample number n)×pilot signals) slot by slot. The output from the first adder multiplied by (4N−2)/(N(N+1)) and the output from the second adder multiplied by (−6)/(N(N+1)) are added in the third adder. The output from the first adder multiplied by (−6)/(N(N+1)) and the output from the second adder multiplied by (12)/(N(N−1)(N+1)) are added in the forth adder. The output from the forth adder is filtered by LPF to obtain output b (k) which is an inclination value of the channel characteristics of a slot, while the output from the third adder is compensated by FLT to obtain a (k) which is a bias value of the channel characteristics.