The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2003

Filed:

Dec. 04, 2001
Applicant:
Inventors:

Morteza Gharib, San Marino, CA (US);

Dominique Fourguette, LA, CA (US);

Frederic Taugwalder, Altadena, CA (US);

Daniel W. Wilson, Montrose, CA (US);

Darius Modarress, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/502 ; G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 1/502 ; G01N 2/100 ;
Abstract

An optical particle detection system produces an optical beam which is scattered by particles in a probe volume area. The particles may scatter the beam to the detector. The optical beam is a hollow shaped beam which may be circular/doughnut shaped, or made be of any other hollow shape. The particle passes across the beam, and those particles which pass through the center of the beam are detected as being desired particles to detect. This system may be used to detect particle concentration, and size. In addition, by producing an asymmetric beam, particle direction can also be detected.


Find Patent Forward Citations

Loading…