The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
Jan. 30, 2002
Jung-Hoon Oh, Seoul, KR;
Byeong-Hwan Cho, Suwon, KR;
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
A tester and method for testing linearity of an analog to digital converter without being influenced by noise, includes a controller that outputs a sampling frequency clock to convert an analog signal into a digital signal, that digitally filters the digitized code value, that generates a histogram responsive to the filtered digitized code value according to a predetermined program, and that controls display of the histogram; a signal generator that generates ground voltage and a triangular wave signal; an analog to digital converter that converts the analog triangular wave signal generated by the signal generator into a digital signal and that outputs the digital signal; a memory that stores the digitized code value converted by the analog to digital converter under control of the controller; and a display that displays the histogram related to the digitally filtered code value generated under control of the controller.