The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2003
Filed:
Feb. 03, 2000
Hitachi, Ltd., Tokyo, JP;
Abstract
A method for handling specific sample solutions for calibration and quality control by an automatic analytical apparatus in which a sample rack to hold calibrator bottles for required analysis items is set on a rack supply unit by an operator. Identification information of all calibrator bottles on the rack is read out, and data on corresponding calibrator samples are also stored. The operator enters analysis items to be measured, and a measuring channel to be used for calibration. Comparison is made between the planned number of requested calibrations and the number of permissible services to determine whether or not calibrator solution is sufficient. If it is determined to be insufficient, the required number of bottles are displayed according to the difference between the number of permissible services and the number of requests, thereby allowing the operator to add the required number of calibrator bottles. Pressing the analysis start button allows the rack holding the calibrator to be moved to the analysis unit, thereby permitting calibration to be performed.