The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2003

Filed:

Nov. 21, 2000
Applicant:
Inventors:

Tsutomu Takagi, Minoo, JP;

Naoya Sato, Suita, JP;

Masaya Tohyama, Toyonaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C07K 1/4435 ; C07H 2/102 ; C07H 2/104 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C07K 1/4435 ; C07H 2/102 ; C07H 2/104 ;
Abstract

The present invention relates to a method for screening and identifying therapeutic agents or preventive agents for central nervous system diseases which comprises assaying a suppressing effect of a test substance on an expression of a splicing variant transcribed from presenilin-2 gene and to a method for examining central nervous system diseases which comprises detecting an expression of a splicing variant transcribed from presenilin-2 gene in a test sample originated from an animal individual.


Find Patent Forward Citations

Takagi, Tsutomu. (2003). Method for examining central nervous system diseases and method for screening remedies (U.S. Patent No. 6579679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6579679

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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