The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2003
Filed:
Mar. 14, 2001
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ;
U.S. Cl.
CPC ...
G06F 1/700 ;
Abstract
An object to be appraised is input and divided into structural elements which are stored in a storage unit. Information is input which indicates an appraisal for the object to be appraised and a combination of elements constituting the object to be appraised is corresponded to the appraisal. The correspondence is classified into criteria which are stored and an arbitrary criterion is selected. A combination of structural elements is obtained on the basis of the selected criterion and appraisal information is inputted for the obtained combination of structural elements.
Kagami, Akira. (2003). Data processing methods and apparatus for supporting analysis/judgement (U.S. Patent No. 6578023). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6578023
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile