The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Jan. 30, 2001
Applicant:
Inventor:

David Erb, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

The present invention provides systems and methods for generating sets of test cases and extends to the sets of test cases and processes using the sets of test cases to develop applications. One aspect of the invention provides a data structure for efficiently storing a set of variable value combinations among which the number of variables can vary. Another aspect of the invention provides systems and methods for sequentially generating test cases to encompass a set of variable value combinations. Advantages of the invention include permitting efficient generation of near minimal sets of test cases that include specified variable value combinations, among which the number of variables can vary, and seed test cases. Sets of test cases produced by the invention are distinctive and have practical value in processes for application development. The test cases permit more efficient and thorough testing of applications, which results in better applications.


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