The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Feb. 16, 1999
Applicant:
Inventor:

David F. Normen, Louisville, CO (US);

Assignee:

Micro Motion, Inc., Boulder, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; G01N 1/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ; G01N 1/100 ;
Abstract

A process parameter associated with a material contained in a vibrating structure is estimated. A plurality of motion signals representing motion at a plurality of locations of the vibrating structure are received. The received plurality of motion signals are force filtered with a force filter to produce a force-filtered motion signal that discriminates motion attributable to a force of interest among a plurality of forces acting on the vibrating structure. A process parameter associated with the material contained in the vibrating structure is estimated from the force filtered motion signal. Preferably, a plurality of motion signal values is generated from the received plurality of motion signals, and force filtering includes the step of applying a force filter matrix to the plurality of motion signal values to produce a force filtered motion signal value. A process parameter, such as mass flow, density or the like, is then estimated from the force filtered motion signal value. According to an aspect of the present invention, the force filter matrix represents a product of a frequency response function matrix for the vibrating structure, a force selectivity matrix and an inverse of the frequency response function matrix. Methods for estimating structural motion, along with related apparatus and computer program products, are also discussed.


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