The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Sep. 26, 2001
Applicant:
Inventors:

Chiaki Fujimoto, Tokyo, JP;

Yukio Fukushima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/500 ;
Abstract

An abnormality detection apparatus for a position detection device is provided which is capable of performing abnormality detection accurately and inexpensively. The position detection device has a primary winding and a secondary winding, and at least one excitation signal each having a predetermined periodic waveform is supplied to the primary winding to thereby generate at least one output signal each in the form of a phase modulated signal corresponding to a rotational position of a rotating member from the secondary winding directly or after having been subjected to phase shifting and appropriate arithmetic operations. The apparatus is provided with an abnormality detection section for determining an abnormality of the position detection device when the phase modulated signal has a peak value which is outside a predetermined range.


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