The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Aug. 01, 2001
Applicant:
Inventors:

Harley R. Myler, Orlando, FL (US);

Michele Van Dyke-Lewis, Orlando, FL (US);

Assignee:

Teranex, Inc., Orlando, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/74 ;
U.S. Cl.
CPC ...
G06K 9/74 ;
Abstract

A method and system for analyzing and measuring image quality between two images. A series of conversions and transformations of image information are preformed to produce a single measure of quality. A YCrCb frame sequence is first converted using RGB conversion to an RGB frame sequence. The resulting RGB frame sequence is converted using spherical coordinate transform (SCT) conversion to SCT images. A Gabor filter is applied to the SCT images to produce a Gabor Feature Set, and a statistics calculation is applied to the Gabor Feature Set. The resulting Gabor Feature Set statistics are produced for both the reference frame and the frame to be compared. Quality is computed for these Gabor Feature Set statistics to produce a video quality measure. Spectral decomposition of the frames is also performable for the Gabor Feature Set, rather than the statistics calculation, allowing graphical comparison of results for the compared frames.


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