The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2003
Filed:
Feb. 20, 2002
Thomas Holz, Dresden, DE;
Abstract
The invention relates to a device for X-ray fluorescence analysis wherein X-radiation of an X-ray source is directed upon a sample arranged on a sample carrier, and the fluorescence radiation is measured by a detector. On that occasion, the detection sensitivity, in particular, with respect to the total reflection X-ray fluorescence (TXRF) is to be increased for the most different samples. In order to solve this problem the sample to be analysed is placed on a multi-layer system, or a fluidic sample flows over such a multi-layer system. The multi-layer system consists of at least two or several individual layers which are arranged in a periodically repeating manner. Adjacent individual layers consist of materials having a different x-ray optical refractive index wherein the period thickness d in the multi-layer system and the angle of incidence &thgr; of the X-radiation meet the BRAGG relationship at the used wavelength &lgr; of X-radiation.