The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6577405 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 10, 2003

Filed:

Jan. 05, 2001
Applicant:
Inventors:

David M. Kranz, Minneapolis, MN (US);

Eric P. Rudd, Hopkins, MN (US);

David Fishbaine, Minnetonka, MN (US);

Carl E. Haugan, St. Paul, MN (US);

Assignee:

CyberOptics Corporation, Golden Valley, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract

An optical system for computing a height of a target on a surface includes a light projector for projecting light. The light passes through a patterned reticle and a projector lens so as to illuminate the target with an image of the pattern. The light is projected telecentrically between the reticle and the projector lens, and a camera is positioned along a receive optical path. The camera receives an image of the target through a receive lens. The target and the pattern move at least three times with respect to each other, and the camera acquires an image of the object at each of at least three positions.


Find Patent Forward Citations

Kranz, David. (2003). Phase profilometry system with telecentric projector (U.S. Patent No. 6577405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6577405

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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