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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6577128 B1

PDFFull Text
Expired
Date of Patent:
Jun. 10, 2003

Filed:

Nov. 05, 2001

Nqr method and apparatus for testing a sample by applying multiple excitation blocks with different delay times

Applicant:
Inventors:

John Alec Sydney Smith, London, GB;

James Barras, London, GB;

Neil Francis Peirson, Northampton, GB;

Assignee:

BTG International Limited, London, GB;

Attorney:

Nixon & Vanderhye

Primary Examiner:

Edward Lefkowitz

Assistant Examiner:

Dixomara Vargas

Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

Methods of and apparatus for Nuclear Quadrupole Resonance (NQR) testing a sample containing quadrupolar nuclei exhibiting a given value of spin-lattice relaxation time, T , are disclosed. The method comprises applying two excitation blocks to excite nuclear quadrupole resonance, there being a given delay time between the two blocks, detecting resonance response signals, and comparing the response signals from respective blocks. The delay time is less than the T value of the nuclei.

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Smith, John Alec Sydney. (2003). Nqr method and apparatus for testing a sample by applying multiple excitation blocks with different delay times (U.S. Patent No. 6577128). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6577128

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