The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2003
Filed:
Feb. 16, 2001
David A. Ansley, Long Beach, CA (US);
Raytheon Company, Lexington, MA (US);
Abstract
A scanning system ( ) and a method permit scanning a desired field-of-view within a maximized field-of-regard at a constant speed without reversing the scan direction about a primary axis ( ). The system includes a mirror ( ) which rotates about the primary axis ( ). The mirror ( ) is supported for rotation about a flip axis ( ) which is perpendicular to the primary axis ( ). Rotation of the mirror ( ) about the primary axis ( ) is divided into a scan period during which the field-of-view is scanned by the mirror ( ), and a flip period during which the mirror ( ) rotates about the flip axis ( ). The mirror ( ) is mounted in a gimbal for independent rotation about a secondary axis ( ) which is parallel to the primary axis ( ). Rotation of the mirror ( ) about the secondary axis ( ) provides an adjustment of the mirror orientation such that at the end of the scan period the mirror ( ) faces the end of the field-of-view, and at the end of the flip period the mirror ( ) faces the beginning of the field-of-view.