The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Jan. 18, 2000
Applicant:
Inventors:

Paul Phillip Van Saarloos, Karrinyup, AU;

Philip George Reid, Wanneroo, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/818 ;
U.S. Cl.
CPC ...
A61B 1/818 ;
Abstract

The present invention provides a method for scanning material with a laser beam including directing a laser beam ( ) through a scanning means, wherein said scanning means includes a first lens ( ) and a second lens ( ) separated by a distance ( ) approximately equal to the focal length of the lenses. The method includes controlling the beam ( ) by moving at least one of the lenses in a plane perpendicular to the beam to scan the material. The invention also provides a scanning apparatus for scanning material with a laser beam including laser means for producing a beam of ultraviolet or infra-red light, scanning means for scanning the laser source in a predetermined pattern onto an area of the material, and controlling means for controlling the scanning means, wherein the scanning means includes two lenses, separated by approximately the focal length of one of the lenses, with at least one of the lenses movable perpendicular to the beam to scan the beam.


Find Patent Forward Citations

Loading…