The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2003
Filed:
Feb. 15, 2000
David Banaszak, New Carlisle, OH (US);
Gary Dale, Kettering, OH (US);
Jeffrey D. Jordan, Hampton, VA (US);
A. Neal Watkins, Hampton, VA (US);
The United States of America as represented by the Secretary of the Air Force, Washington, DC (US);
Abstract
A method and device for visually detecting crack length of a temperature sensitive paint coated test structure during excitation of the test structure. The method and device of the invention capitalizes on surface temperature changes of the test structure as structural fatigue increases. Test structure surface temperature changes are realized in corresponding fluorescence intensity changes in the temperature sensitive paint and recorded with a CCD camera. Improvements over conventional structural fatigue systems include the ability to detect fatigue during flight testing, to record fatigue without stopping the electrodynamic excitation and the ability to detect crack onset and crack length resulting in more accurate cycles-to-fatigue analysis.