The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Jun. 28, 2002
Applicant:
Inventors:

Michael J. DeBar, Rochester, NY (US);

Zhihao Yang, Webster, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 5/00 ; G01L 7/18 ;
U.S. Cl.
CPC ...
G01F 5/00 ; G01L 7/18 ;
Abstract

A method of measuring absolute static pressure at one or more positions along the wall of a microfluidic device transporting a working fluid that is immiscible in a first selected gas environment, includes providing a first fluid conducting channel having an atmosphere provided by the selected gas environment under a sealed environment and in communication with the microfluidic device at a first point of communication; providing a visual scale adjacent to the first fluid conducting channel; and transporting the working fluid under pressure conducted by the microfluidic device into the first fluid conducting channel such that the volume transported into such first fluid conducting channel varies depending upon the absolute static pressure of the working fluid at the first point of communication, whereby the absolute static pressure at the first point of communication is visually determined depending on the position of the interface of the working fluid and the first selected gas environment in the first fluid conducting channel when compared with the first visual scale.


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