The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Feb. 26, 2001
Joe Caruso, Staatsburg, NY (US);
Aliza R. Heching, Bronx, NY (US);
Ramesh Inaganti, Carmichael, CA (US);
Ying Tat Leung, Tarrytown, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer method improves the robustness of population parameters estimated using sample responses. Two different factors that may impact the accuracy of estimates are considered. The first factor is referred to as statistical outliers. By statistical outliers, what is meant is observations that fall “statistically outside” of the other remaining observations in the sample. The second factor considered is the impact of the weight assigned to each observation on the overall parameter estimate. More specifically, the fact that weights assigned to each respondent are typically estimated and thus not exact is addressed. Consequently, the weights do not unduly influence the value of the parameter estimates.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile