The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2003

Filed:

Aug. 29, 2001
Applicant:
Inventors:

Hisayoshi Sato, Tokyo, JP;

Hisashi Osumi, Tokyo, JP;

Naruhiro Irino, Yono, JP;

Assignee:

Chuo University, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/00 ;
U.S. Cl.
CPC ...
G01L 1/00 ;
Abstract

The invention discloses a method for analyzing nonlinear restoring force characteristic with hysteresis of a machine structure system, capable of easily and high-accurately performing analysis of nonlinear vibration characteristic of the machine structure system having a displacement strain characteristic dependent on a past history. When analysis is performed for the nonlinear restoring force characteristic of the machine structure system, having force-displacement hysteresis, approximate mode analysis is carried out by representing the nonlinear restoring force characteristic having the history by an equivalent linear characteristic.


Find Patent Forward Citations

Sato, Hisayoshi. (2003). Method for analyzing nonlinear restoring force characteristic with hysteresis of machine structure system (U.S. Patent No. 6574570). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6574570

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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