The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2003

Filed:

Jan. 07, 1998
Applicant:
Inventors:

Mitsutoshi Arai, Tokyo, JP;

Takahiro Hongu, Tokyo, JP;

Kouichirou Hirao, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 ;
U.S. Cl.
CPC ...
G06K 9/46 ;
Abstract

An apparatus for pattern matching encoding includes a pattern extracting unit for extracting patterns in input binary or multi-level image data, an accumulating/match-checking unit for accumulating each extracted pattern and executing a match-check thereof with patterns that have been accumulated, a line segment checking unit for checking each pixel in the match pattern or the extracted pattern as to which line segment in directions the pixel is positioned on, and an encoding unit for encoding the extracted pattern by selecting a template having an optimum form according to the result of the line segment checking. The codes in pattern matching encoding are reduced, and the efficiency of code transmission and code accumulation is improved.


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