The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Apr. 04, 2000
Susumu Kawakami, Kawasaki, JP;
Masahiro Matsuoka, Kawasaki, JP;
Hiroaki Okamoto, Kawasaki, JP;
Shinya Hosogi, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
There is disclosed a technology of measuring three-dimensional geometric information on a plane and position information on a point from an image such as the optical flow pattern and a stereo image. It is to determine an azimuth of a measuring plane and/or a superposing time in which the measuring plane is superposed on a predetermined observation point, using a compound ratio {p p p p }, which is determined by four positions p , p , p , p of a measuring point, where p and p denote measuring positions at mutually different two measuring times on an arbitrary measuring point appearing on an image obtained through viewing a predetermined measurement space from a predetermined observation point inside the measurement space, respectively, p denotes a position of the measuring point after an infinite time elapses, and p denotes a position of the measuring point at a superposing time in which a measuring plane including the measuring point is superposed on the observation point in the moving continuous state.