The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Apr. 22, 2002
Ming-Hui Lin, Hsin-Chu, TW;
Tung-Fa Liou, Hsin-Chu, TW;
Industrial Technology Research Institute, Hsin-Chu Hsien, TW;
Abstract
A 3D shape-measuring apparatus using biaxial anamorphic magnification comprises a light source that projects a light onto an object surface to be sensed. Via an electrical image-grabbing device, such as CCD camera, the light reflected from the object is grabbed to determine the coordinate locations sensed on the object. Before the electrical image-grabbing device, the light reflected from the object passes respectively through a curved reflecting mirror or an assembly of telecentric cylindrical lenses to adjust an image magnification along the light projection direction, and an assembly of cylindrical lenses to adjust an image magnification along a direction perpendicular to the light projection direction. Thereby, resolution nonuniformity with respect to near and far distance is resolved while the observable range of the CCD camera can further be efficiently changed into a measurable field.