The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2003

Filed:

May. 14, 2002
Applicant:
Inventors:

Charles Qian, Cupertino, CA (US);

Jianying Cao, San Jose, CA (US);

Yi Qin, Pleasanton, CA (US);

Assignee:

Nexfon Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/714 ;
U.S. Cl.
CPC ...
G02B 2/714 ;
Abstract

Optical interleavers and de-interleavers that can be used to combine and separate optical signals are described. These devices are based on Mach-Zehnder interferometers having one or two Gires-Toumois mirrors. The optical designs disclosed herein include several key improvements over prior arts. These improvements of interleavers enabled lower cross talk and more accurate channel center frequencies. The new designs also improve on the stability of the devices and substantially reduce the manufacturing costs. With the usage of multi-fiber collimators, a pair of interleaver and de-interleaver is fabricated using the same optical block thereby further reducing the manufacturing costs.


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