The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Feb. 16, 2001
Applicant:
Inventors:
Stephen E. Bachman, Amarillo, TX (US);
Michael E. Hubbert, Taos, NM (US);
Assignee:
Ganado Research, L.L.C., Amarillo, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/50 ;
U.S. Cl.
CPC ...
G01J 3/50 ;
Abstract
An optical method to measure certain optical characteristics of starch-containing materials during and/or after processing. Certain properties of the processed starch-containing materials such as flake weight and starch availability can be accurately estimated from the measured optical characteristics.
Bachman, Stephen. (2003). Optical method to monitor the processing of a starch-containing material (U.S. Patent No. 6573994). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6573994
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile