The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Apr. 17, 2000
Applicant:
Inventors:
Michael B. Carter, Ames, IA (US);
Andreas Hugo Walter Johannsen, Redmond, WA (US);
Assignee:
Unigraphics Solutions Inc., Cypress, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/120 ;
U.S. Cl.
CPC ...
G06T 1/120 ;
Abstract
A backface culling technique for clusters of polygons, as well as a method for generating efficient clusters from a set of triangle strips. The cluster backface test is directly derived from the traditional single-polygon test, and has about the same complexity. Memory requirements are 40 bytes per test. The cluster backface tests may be arranged hierarchically, with frontface tests added for symmetry. Experiments show graphics performance improvements of up to 50% in terms of number of effective polygons rendered per second.