The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2003
Filed:
Jul. 26, 2001
Applicant:
Inventor:
Sang-Hun Lee, Seoul, KR;
Assignee:
Wooyoung Co. Ltd., Seoul, KR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 1/200 ;
U.S. Cl.
CPC ...
H01R 1/200 ;
Abstract
The present invention relates to a socket for testing an integrated circuit utilizing an improved contact pin structure. In the test socket of the present invention, the length of the electrical path between the leads of tested IC and terminals of PCB is minimized and the contact pin may maintain wiping action in a wide area of contact portions. Further, as the contact pin may accommodate the pressure applied by the IC leads with great elasticity and provides sufficient floating suspension when the pressure is removed, the invention may efficiently prevent damages to the leads of IC being tested and extend the life of the contact pin.