The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2003

Filed:

Jan. 30, 2001
Applicant:
Inventor:

Neil K Hastilow, Bristol, GB;

Assignee:

Rolls-Royce PLC, London, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/20 ; G01B 3/14 ; G06G 1/00 ;
U.S. Cl.
CPC ...
G01B 5/20 ; G01B 3/14 ; G06G 1/00 ;
Abstract

A conformance gauge is used as an inspection tool to check that component features lie within tolerance limits. When the component has been designed using CAD tools the CAD data file defining external surfaces of the component is used as the basis to create a second CAD data file defining the surfaces of the inspection to conform to the corresponding surfaces of the component. Viewing apertures or slots are then defined in the data file to the tolerance limits of features to be checked. The second CAD data file is then provided to a rapid prototyping system, eg a stereolithography machine to produce the final inspection gauge.


Find Patent Forward Citations

Hastilow, Neil. (2003). Conformance gauge (U.S. Patent No. 6571484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6571484

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…