The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2003
Filed:
Dec. 09, 1999
Hideshi Maeno, Tokyo, JP;
Tokuya Osawa, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A semiconductor integrated circuit device with fault analysis function performs test operation for a memory circuit (such as a RAM) in which a comparison control circuit ( ) generates a comparison control signal CCMP in order to select one or more memory cells in each memory cell group ( and ) corresponding to a single bit, a specified row, a specified bit, or a specified pattern, and then outputs the comparison control signal CCMP to scan flip flops ( and ) each including a comparator ( ). The comparator ( ) performs the comparison operation between data and expected values EXP and then outputs a comparison result only when address signals are input and data are red from memory cells, as the object of test, addressed by these address signals.