The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2003

Filed:

Sep. 25, 2002
Applicant:
Inventors:

Atsutoshi Goto, Fuchu-shi, Tokyo, JP;

Kazuya Sakamoto, Hamura, JP;

Nobuyuki Akatsu, Higashiyamato, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 1/700 ;
U.S. Cl.
CPC ...
G01C 1/700 ;
Abstract

The present invention is directed to a position detection method and apparatus whereby a first A.C. output signal having an electric phase angle shifted in a positive direction in accordance with a position-to-be-detected is produced along with a second A.C. output signal having an electric phase angle shifted in a negative direction. First and second detection data are then generated by detecting respective phase differences of the first and second A.C. output signals from a predetermined reference phase. The first and second predicted values are provided on the bases of at least two successive samples of the first and second detection data, respectively. The first and second predicted values are then modified to provide a standard predicted value for correcting any nonlinear error resulting from the Doppler effect. Using this standard predicted value, predictive interpolation is performed on the first and second detection data sequentially with the passage of time to provide first and second interpolated data.


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