The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2003
Filed:
May. 14, 2001
Nanette C. Jensen, Meridian, ID (US);
Douglas G. Keithley, Boise, ID (US);
Virginia K. Capps, Boise, ID (US);
David G. Bohan, Eagle, ID (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A system and method are provided for calibrating an output from a sensor array in a scanner. The system comprises a processor circuit having a processor and a memory. Stored on the memory and executable by the processor is the scanner calibration logic. The scanner calibration logic comprises logic for determining a minimum dark value for the sensor array, and logic for determining an optimum exposure time of a number of light sources associated with the sensor array. The scanner calibration logic also includes logic for determining a maximum white value for the sensor array at the exposure time, and logic for setting an analog offset based upon the minimum dark value. The scanner calibration logic further comprises logic for setting an analog gain associated with the sensor array based on a sensor output range from the minimum dark value to a maximum white value.