The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2003

Filed:

May. 04, 1999
Applicant:
Inventors:

Urs Utzinger, Austin, TX (US);

Anthony J. Durkin, Watertown, MA (US);

Holger Fuchs, Tempe, AZ (US);

Ann M. Gillenwater, Pearland, TX (US);

Douglas L. Heintzelman, Plainfield, IN (US);

Rebecca R. Richards-Kortum, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

Methods and apparatus for performing fluorescence and spatially resolved reflectance spectroscopy on a sample. A sample is irradiated with a fluorescence excitation fiber and radiation is collected from the sample with a fluorescence collection fiber and detected to form fluorescence spectra. The sample is also illuminated with a reflectance illumination fiber and reflected light from the sample is collected at a plurality of collection positions and detected to form spatially resolved reflectance spectra. The fibers may form a probe arranged in concentric sections. The spectra are analyzed by pre-processing and reducing the dimensionality of the spectral data.


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