The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2003
Filed:
Aug. 19, 2002
Michael J. LaGasse, Lexington, MA (US);
AXE, Inc., Maynard, MA (US);
Abstract
An apparatus and method for cleaving optical waveguides to precise differential length are described. A first end of a waveguide is coupled to an input port of a reflectometer. A reference mirror is then positioned in a path of radiation propagating through the second end of the waveguide. A waveguide cutting tool is then positioned proximate to the waveguide and at a distance relative to a reference mirror. A first reflectometry measurement is performed on the waveguide to a second end of the waveguide. A second reflectometry measurement is performed on the waveguide to the reference mirror. The waveguide is then positioned relative to the reference mirror and waveguide cutting tool so that the first reflectometery measurement is a measurement increment apart from the second reflectometry measurement. The waveguide is then cut with the cutting tool positioned at the distance relative to the reference mirror. The method is repeated for a new waveguide with the measurement increment being the same measurement increment displaced by a different measurement increment that corresponds to a desired differential length between the waveguide and the new waveguide.