The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2003

Filed:

Jan. 30, 2002
Applicant:
Inventors:

Junji Sugisawa, Santa Clara, CA (US);

Larry Kan, Fremont, CA (US);

David Greenhill, Portola Valley, CA (US);

Joseph Siegel, Shrewsbury, MA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 1/9096 ;
U.S. Cl.
CPC ...
H03K 1/9096 ;
Abstract

A scannable latch for use within a circuit path of a series of one or more dynamic circuits is provided. The scannable latch provides both latch functionality during normal operation and scan test functionality during scan mode operation. Particularly, the scannable latch has a dynamic input stage and a shadow latch, where the dynamic input stage's primary function occurs during normal operations and where the shadow latch's primary function occurs during scan operations. The scannable latch also has an output gate operatively connected to the dynamic input stage and shadow latch.


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