The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2003

Filed:

Oct. 02, 2000
Applicant:
Inventors:

Nick A. Demma, Minneapolis, MN (US);

Michael R. Elgersma, Plymouth, MN (US);

LeRoy E. Vetsch, Glendale, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/14 ; G01R 2/726 ;
U.S. Cl.
CPC ...
G01B 7/14 ; G01R 2/726 ;
Abstract

A system and method for determining characteristics of a proximity sensor. According to a preferred embodiment, the admittance of a proximity sensor/cable assembly is measured at two frequencies. Assumptions about sensor characteristics and cable characteristics are made, and an admittance corresponding to the assumed characteristics is derived. The assumptions are adjusted to obtain a correspondence between the measured admittance and the derived admittance. When the assumptions have been updated a specified number of times or when a desired accuracy threshold has been met, the adjusted assumptions may be used to determine one or more sensor characteristics, such as the separation between the proximity sensor and the target object.


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