The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2003

Filed:

Jan. 28, 2002
Applicant:
Inventors:

Shuji Nakaya, Kobe, JP;

Mitsuaki Hayashi, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/976 ;
U.S. Cl.
CPC ...
H01L 2/976 ;
Abstract

On a semiconductor substrate surface, a drain diffusion layer, which is in common to two transistors that make up a memory cell pair, is formed and source diffusion layers, for each of the transistors, respectively, are formed so as to sandwich the drain diffusion layer from both sides, a bit line is formed from a lower wiring layer and is connected to the drain diffusion layer, a source line is formed from the uppermost wiring layer, and the writing of information is performed by making a contact hole exist or non-existent immediately below the source line arranged from the uppermost wiring layer, in other words, by connection or non-connection of the source diffusion layer with the source line. By this arrangement, the TAT can be shortened and, since the capacitance of the bit line is not increased, high-speed operation with a short precharge time and discharge time for the bit line can be realized and the consumption power can be lessened.


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