The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2003
Filed:
Feb. 28, 2001
Delmar L. Barker, Tucson, AZ (US);
Harry A. Schmitt, Tucson, AZ (US);
Stephen M. Schultz, Tucson, AZ (US);
Raytheon Company, Lexington, MA (US);
Abstract
A method for measuring acceleration uses an accelerometer apparatus having an optically transparent, stress-birefringent material, a source of polarized light positioned to direct a polarized beam of light into the optically transparent, stress-birefringent material, and a detector system positioned to detect an output beam from the optically transparent, stress-birefringent material. The accelerometer apparatus is accelerated, and the acceleration of the accelerometer apparatus is simultaneously determined from a measurement of stress-induced optical birefringence in the optically transparent, stress-birefringent material.