The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

May. 31, 2001
Applicant:
Inventors:

Yoram Koren, Ann Arbor, MI (US);

Reuven Katz, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

An inspection apparatus, system and method for inspecting parts during a manufacturing process. The apparatus comprises a conveyor line for moving a part during a manufacturing process and a plurality of sensors and cameras mounted on stationary supports around the conveyor line. The conveyor line may be a part of or adjacent to the production line. The sensors measure a characteristic of a first part and produce an inspection output, and can be reconfigured for inspection of at least one different characteristic of a second part or for re-inspection of the first part at a different stage of the manufacturing process. The apparatus may include a computer system that receives the sensor inspection outputs and produces operator-accessible information. The apparatus may include means for identification of the parts. Alternatively, the parts may be stationary and the supports on which the sensors are mounted may be moving relative to the parts.


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