The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2003
Filed:
Jul. 24, 2001
Nobuaki Takeuchi, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
A semiconductor testing apparatus capable of displaying its measurement results in an easily understandable manner is provided. The apparatus comprises a display section for displaying a measurement result of a change in time of a voltage distribution on a measurement plane of a measured device and an input section for entering parameters for the display of the measurement result. When a measurement time is entered as a parameter, the display section displays the measurement result by means of a three-dimensional graph and a representation in numerals, letters or symbols of the measurement time. The graph shows along its three axes a first coordinate in a first direction on the measurement plane, a second coordinate in a second direction which is perpendicular to the first direction, and a voltage at the measurement time at a position on the measurement plane defined by the first and second coordinates.