The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

Jun. 29, 2001
Applicant:
Inventors:

John R. Baldwin, Newtown, CT (US);

Thomas James Batko, Wallingford, CT (US);

Daming Yu, Easton, CT (US);

Assignee:

Hubbell Incorporated, Orange, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/1327 ;
U.S. Cl.
CPC ...
G01R 3/1327 ;
Abstract

A system and method are provided for ensuring increased accuracy of individual relays (e.g., within a control system including a sensor) to close substantially coincidentally with respect to a current zero-crossing of an incoming power supply waveform. To determine timing of contact operation, a microcontroller operates the contacts in response to one of a series of test pulses, and determines the amount of time required for contact operation. The difference between timing of contact operation and zero-crossing is determined and adjusted to offset errors incurred by microcontroller threshold variations and power supply voltage variations. The calibrated value is then provided to the sensor in order to extend sensor life.


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