The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

Jul. 19, 1999
Applicant:
Inventors:

Peter Speier, Stafford, TX (US);

Martin E. Poitzsch, Sugar Land, TX (US);

Steven F. Crary, Sugar Land, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

An NMR measurement apparatus is potentially subject to relative motion between the apparatus and a sample. The measurement apparatus includes at least one magnet, at least one coil and circuitry that is coupled to the magnet(s) and coil(s). The circuitry is adapted to use the magnet(s) and coil(s) to perform at least one NMR measurement and indicate the results of the NMR measurement(s). The results are then analyzed to determine an effect of the motion on the measurement(s).


Find Patent Forward Citations

Speier, Peter. (2003). Detecting tool motion effects on nuclear magnetic resonance measurements (U.S. Patent No. 6566874). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6566874

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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