The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2003
Filed:
Aug. 07, 2001
Jay J. Brandinger, Pennington, NJ (US);
Brian D. Hoffman, Princeton, NJ (US);
Edward T. Polkowski, Lloyd Harbor, NY (US);
Westar Photonics, Inc., Pennington, NJ (US);
Abstract
A method for making accurate and precise customized corrections to the surface of an optical lens is described. An electronic correction contour is generated from a measured refractive correction for a patient, and transferred to the surface of the lens by ablation etching with one or more laser pulses. After each of the laser pulses, the refractive properties of the lens are measured and compared to the electronic contour correction derived from a patient's refractive correction. The ablation etching is terminated in localized areas where the refractive properties match the electronic correction contour. End point detection includes monitoring refractive qualities of the lens during the recontouring process, modifying the pattern through changes in the laser pulses.