The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

Mar. 06, 2002
Applicant:
Inventors:

Alexander Roger Deas, Edinburgh, GB;

Vladimir Nikolayevich Davydov, St.Petersburg, RU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ; H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/14763 ; H01L 2/100 ;
Abstract

A method for producing a probe unit for contacting an electronic circuit such as a wafer or a die having a predetermined pattern of contact pads deployed in a common plane. The method employes a base plate of made of a material capable of surface uplift when irradiated. On the surface of the base plate locations corresponding to said contact pads are determined. Further, the base plate is irradiated at the determined locations by means of a laser. This results in forming conical surface uplifts. The method further includes plating the conical surface uplifts with an electrically conductive material and providing means for electical connection between said plated conical surface uplifts and an external device.


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