The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2003
Filed:
Dec. 27, 1995
Applicant:
Inventors:
Manuel Perucho, San Diego, CA (US);
Miguel Angel Peinado, Barcelona, ES;
Yurij Ionov, San Diego, CA (US);
Sergei Malkhosyan, San Diego, CA (US);
Michael McClelland, Encinitas, CA (US);
John Welsh, Leucadia, CA (US);
Assignee:
Stratagene, La Jolla, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ;
Abstract
The detection of insertions and/or deletions in reiterated nucleotide sequences in tissues provides an identification of neoplastic changes that are associated with malignancy. The mutations are preferably detected by PCR based amplification of target sequences using selected primers, followed by standard analytic procedures. The detection of these mutations is useful as a diagnostic tool for cancer development and has direct application for cancer prognosis.