The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2003

Filed:

Jul. 25, 2001
Applicant:
Inventors:

Katsuhiko Kobayashi, Tokyo, JP;

Toshifumi Mihashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract

An ocular optical characteristic measuring apparatus measures light intensity distribution in a target image projected on the fundus of an eye and determines the ocular optical characteristic of the eye on the basis of the light intensity distribution. A light-projecting optical system projects light emitted by a light source on the eye to form a target image on the fundus of the eye, a light-receiving optical system focuses reflected light reflected by the fundus to form a target image on a photoelectric device. An arithmetic unit determines a light intensity distribution in the target image formed on the photoelectric device on the basis of an image signal provided by the photoelectric device and estimates the optical characteristic of the eye from the light intensity distribution in the target image. Substantially all scatter-reflected light is removed from the reflected light reflected by the fundus of the eye and substantially only regularly reflected light regularly reflected by the fundus of the eye is transmitted to the photoelectric device.


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