The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2003
Filed:
Nov. 13, 2001
Range-extending system and spatial filter for enhancing hartmann-shack images and associated methods
John Alfred Campin, Orlando, FL (US);
Alcon Universal Ltd., Hunenberg, CH;
Abstract
A range of a wavefront sensor is extended by focusing collimated light onto a lenslet array, an output creating a grid formed by edges of the lenslets and a reference spot in the members of the grid. Each reference spot has a known relationship to the grid member and a centroid. A relationship between the reference centroids is determined. Next a wavefront emanating from an eye is focused onto the lenslet array, with the output from the lenslet array forming the grid and aberrated eye spots thereon, each eye spot having a centroid. A relationship between the eye spot centroids is determined. One known relationship between one reference centroid and the centroid of one eye spot is identified. Finally, at least some of the remaining relationships between the reference centroids and the eye spot centroids are determined. The determined relationships provide a measure indicative of the eye aberration.